While not a fully-fledged “project”, a substantial portion of my work (including that on other projects) involves developing novel techniques for various tools, including the TEM, SEM, and FIB (on the data analysis side of things, see these two projects as examples).
Electron/Ion Microscopy Method Development
Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers
In this work, we demonstrate a simple spin-coating system that can be used to easily coat planar samples with a conductive polymer film. Such a system provides protection to samples during FIB imaging and milling at a fraction of the cost of traditional coating instruments.
Microscopy and Microanalysis 23(4), 872, 2017