Electron/Ion Microscopy Method Development

While not a fully-fledged “project”, a substantial portion of my work (including that on other projects) involves developing novel techniques for various tools, including the TEM, SEM, and FIB (on the data analysis side of things, see these two projects as examples).


In this work, we demonstrate a simple spin-coating system that can be used to easily coat planar samples with a conductive polymer film. Such a system provides protection to samples during FIB imaging and milling at a fraction of the cost of traditional coating instruments.
Microscopy and Microanalysis 23(4), 872, 2017


Compressive Sensing Reconstruction for EDS Analysis
Aug 8, 2018
Analytical and Microstructural Microscopy Approaches for Materials Characterization
Dec 13, 2016