Electron/Ion Microscopy Method Development
While not a fully-fledged “project”, a substantial portion of my work (including that on other projects) involves developing novel techniques for various tools, including the TEM, SEM, and FIB (on the data analysis side of things, see these two projects as examples).
Joshua Taillon
Materials Data Scientist
A materials research scientist at NIST interested in scientific data curation, AI for materials research, and baking bread.
Publications
Characterization of Zinc Carboxylates in an Oil Paint Test Panel
Zinc (carboxylate) soaps, formed by reactions between zinc oxide (ZnO) and fatty acids in a drying oil, are known to cause …
Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers
This letter describes an innovative spin-coating system, built from off-the-shelf components, that can easily and inexpensively be …
Talks
Analytical and Microstructural Microscopy Approaches for Materials Characterization
Abstract: The atomic-level structure and chemistry of materials ultimately dictate their observed macroscopic properties and behavior. …