Aivars J. Lelis

Latest

• Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO$_\sf{2}$ interfaces using HRTEM and STEM-EELS
• Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO$\sf_2$ Structures using TEM and XPS
• Systematic structural and chemical characterization of the transition layer at the interface of NO-annealed 4H-SiC/SiO$\sf_2$ metal-oxide-semiconductor field-effect transistors