Joshua Taillon

Materials Data Scientist

National Institute of Standards and Technology


Dr. Joshua Taillon is a staff scientist within the Office of Data and Informatics at the National Institute of Standards and Technology (Material Measurement Laboratory). As a Materials Research Engineer, his professional interests lie at the intersection of materials characterization and data science, utilizing state-of-the art signal and data processing techniques to facilitate greater understanding of material systems.

Joshua received a B.S. from Cornell University, and as an NSF Graduate Research Fellow, he received his Ph.D. from the University of Maryland under the supervision of Professor Lourdes Salamanca-Riba. While at Maryland, he specialized in analytical transmission electron microscopy and focused ion beam nanotomography, with applications in wide bandgap microelectronics and solid oxide fuel cells. In December 2016, he was presented with a Graduate Student Award from the Materials Research Society for his analytical TEM investigations of 4H-SiC MOSFET interfaces. Following this, he spent two years as a postdoc at NIST working with Dr. Keana Scott (funded by an NRC grant), researching the application of compressed sensing strategies to enhance chemical spectroscopic analysis within electron microscopes.


  • Machine Learning for Materials Science
  • Computational Microscopy
  • Open Software Development
  • Focused Ion Beam Method Development
  • Materials Characterization Research


  • Ph.D. - Materials Science and Engineering, 2016

    University of Maryland, College Park

  • M.S. - Materials Science and Engineering, 2014

    University of Maryland, College Park

  • B.S. - Materials Science and Engineering, 2011

    Cornell University

Recent & Upcoming Talks

Open-source hyper-dimensional materials analytics using HyperSpy

With modern advances in computer technology, materials characterization techniques such as electron microscopy (EM) are generating …

Data Analysis in Materials Science

8-hour Sunday Short Course presented at the 2021 Microscopy and Microanalysis Meeting


Compressed Sensing for X-ray Elemental Analysis

Reconstructing sparse EDS data into interpretable results.


A multi-dimensional data analysis toolbox.

Materials Data Management

Streamlining data pipelines in materials research

Electron/Ion Microscopy Method Development

Novel ways to use incredible tools.

Signal Separation in Electron Microscopy

Investigating how to extract pure signals from spectroscopic data.

3D Tomography of solid oxide fuel cells

Analyzing the impacts of degradation through 3D reconstruction.

Characterization of 4H-SiC MOSFETs

Using TEM to find the impact of interfacial defects on SiC performance.

ZnO Nanowires for Hybrid photovoltaics

Optimizing growth parameters for ZnO nanowires.

Recent Posts

A not-too-frequently updated blog…

The Next Step

Moving on from my NIST postdoc…

Hello Hugo!

Saying hello from the new Hugo-powered site…

Shifting Time Stamps on Photos

A useful tip for when your camera’s time settings were off…


  • joshua DOT taillon AT nist DOT gov
  • jat255 AT gmail DOT com
  • Office: (303) 497-5309
  • 325 Broadway, Boulder, CO, 80305, United States