Selected Publications

Total citations: 110; h-index: 6

We report a transmission electron microscopy (TEM) study of the impacts of phosphorus and boron passivation processes at 4H-SiC/SiO$_\sf{2}$ interfaces.
Applied Physics Letters 113, 193503, 2018

In this work, we present a number of techniques to improve the quality of the acquired nanotomography data, together with easy-to-implement methods to obtain “advanced” microstructural quantifications. The techniques are applied to a solid oxide fuel cell cathode of interest to the electrochemistry community, but the methodologies are easily adaptable to a wide range of material systems.
Ultramicroscopy 184(A), 24, 2018

In this work, we demonstrate a simple spin-coating system that can be used to easily coat planar samples with a conductive polymer film. Such a system provides protection to samples during FIB imaging and milling at a fraction of the cost of traditional coating instruments.
Microscopy and Microanalysis 23(4), 872, 2017

Other Past & Upcoming Publications

More Publications

. Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy. Microscopy and Microanalysis, 2017.

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. Boron-doped few-walled carbon nanotubes: novel synthesis and properties. Nanotechnology, 2016.

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. Near-Field Optical Properties of Fully Alloyed Noble Metal Nanoparticles. Advanced Optical Materials, 2016.

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Projects

Past and Present

Compressed Sensing for X-ray Elemental Analysis

Reconstructing sparse EDS data into interpretable results.

HyperSpy

A multi-dimensional data analysis toolbox.

Electron/Ion Microscopy Method Development

Novel ways to use incredible tools.

Signal Separation in Electron Microscopy

Investigating how to extract pure signals from spectroscopic data.

3D Tomography of solid oxide fuel cells

Analyzing the impacts of degradation through 3D reconstruction.

Characterization of 4H-SiC MOSFETs

Using TEM to find the impact of interfacial defects on SiC performance.

ZnO Nanowires for Hybrid photovoltaics

Optimizing growth parameters for ZnO nanowires.

Blog Posts

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Moving on from my NIST postdoc…

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Saying hello from the new Hugo-powered site…

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A useful tip for when your camera’s time settings were off…

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Contact

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  • joshua.taillon AT nist DOT gov
  • Office: (301) 975-2913
  • 100 Bureau Drive Stop 8372, Gaithersburg, MD 20899