# Selected Publications

Total citations: 81; h-index: 5

### Improving microstructural quantification in FIB/SEM nanotomography

In this work, we present a number of techniques to improve the quality of the acquired nanotomography data, together with easy-to-implement methods to obtain “advanced” microstructural quantifications. The techniques are applied to a solid oxide fuel cell cathode of interest to the electrochemistry community, but the methodologies are easily adaptable to a wide range of material systems.
Ultramicroscopy,2018

### Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers

In this work, we demonstrate a simple spin-coating system that can be used to easily coat planar samples with a conductive polymer film. Such a system provides protection to samples during FIB imaging and milling at a fraction of the cost of traditional coating instruments.
Microscopy and Microanalysis,2017

### Systematic structural and chemical characterization of the transition layer at the interface of NO-annealed 4H-SiC/SiO$\sf_2$ metal-oxide-semiconductor field-effect transistors

In this work, we characterize the transition layer at the 4H-SiC/SiO2 interface as a function of nitric oxide (NO) post-annealing time using HRTEM and EELS. We confirm an inverse relationship between NO-anneal time and transition layer width, which correlates with improved channel mobility.
Journal of Applied Physics,2013

# Recent & Upcoming Publications

. Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO$_\sf{2}$ interfaces using HRTEM and STEM-EELS. In Preparation, 2018.

. Detection of unique interfacial states in SiC MOS devices via spectral unmixing of EELS spectrum images. In Preparation, 2018.

. Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy. Microscopy and Microanalysis, 2017.

# Projects

Past and Present

#### Compressed Sensing for X-ray Elemental Analysis

Reconstructing sparse EDS data into interpretable results.

#### HyperSpy

A multi-dimensional data analysis toolbox.

#### Electron/Ion Microscopy Method Development

Novel ways to use incredible tools.

#### Signal Separation in Electron Microscopy

Investigating how to extract pure signals from spectroscopic data.

#### 3D Tomography of solid oxide fuel cells

Analyzing the impacts of degradation through 3D reconstruction.

#### Characterization of 4H-SiC MOSFETs

Using TEM to find the impact of interfacial defects on SiC performance.

#### ZnO Nanowires for Hybrid photovoltaics

Optimizing growth parameters for ZnO nanowires.

# Blog Posts

### Hello Hugo!

Saying hello from the new Hugo-powered site…

### Shifting Time Stamps on Photos

A useful tip for when your camera’s time settings were off…

### Default Qt Font in Ubuntu 13.04

Fixing a nuisance from Ubuntu’s default settings…

# Contact

• jat255 AT gmail DOT com
• joshua.taillon AT nist DOT gov
• Office: (301) 975-2913
• 100 Bureau Drive Stop 8372, Gaithersburg, MD 20899