Selected Publications

Total citations: 81; h-index: 5

In this work, we present a number of techniques to improve the quality of the acquired nanotomography data, together with easy-to-implement methods to obtain “advanced” microstructural quantifications. The techniques are applied to a solid oxide fuel cell cathode of interest to the electrochemistry community, but the methodologies are easily adaptable to a wide range of material systems.
Ultramicroscopy,2018

In this work, we demonstrate a simple spin-coating system that can be used to easily coat planar samples with a conductive polymer film. Such a system provides protection to samples during FIB imaging and milling at a fraction of the cost of traditional coating instruments.
Microscopy and Microanalysis,2017

In this work, we characterize the transition layer at the 4H-SiC/SiO2 interface as a function of nitric oxide (NO) post-annealing time using HRTEM and EELS. We confirm an inverse relationship between NO-anneal time and transition layer width, which correlates with improved channel mobility.
Journal of Applied Physics,2013

Recent & Upcoming Publications

More Publications

. Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO$_\sf{2}$ interfaces using HRTEM and STEM-EELS. In Preparation, 2018.

Project

. Detection of unique interfacial states in SiC MOS devices via spectral unmixing of EELS spectrum images. In Preparation, 2018.

Project

. Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy. Microscopy and Microanalysis, 2017.

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Projects

Past and Present

Compressed Sensing for X-ray Elemental Analysis

Reconstructing sparse EDS data into interpretable results.

HyperSpy

A multi-dimensional data analysis toolbox.

Electron/Ion Microscopy Method Development

Novel ways to use incredible tools.

Signal Separation in Electron Microscopy

Investigating how to extract pure signals from spectroscopic data.

3D Tomography of solid oxide fuel cells

Analyzing the impacts of degradation through 3D reconstruction.

Characterization of 4H-SiC MOSFETs

Using TEM to find the impact of interfacial defects on SiC performance.

ZnO Nanowires for Hybrid photovoltaics

Optimizing growth parameters for ZnO nanowires.

Blog Posts

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Saying hello from the new Hugo-powered site…

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A useful tip for when your camera’s time settings were off…

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Fixing a nuisance from Ubuntu’s default settings…

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