Lourdes G. Salamanca-Riba

Latest

• Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO$_\sf{2}$ interfaces using HRTEM and STEM-EELS
• Improving microstructural quantification in FIB/SEM nanotomography
• Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers
• Near-Field Optical Properties of Fully Alloyed Noble Metal Nanoparticles
• Long-Term Cr Poisoning Effect on LSCF-GDC Composite Cathodes Sintered at Different Temperatures
• Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO$\sf_2$ Structures using TEM and XPS
• Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM
• Investigating the Relationship between Operating Conditions and SOFC Cathode Degradation
• A Study of SOFC Cathode Degradation in H$\sf_2$O Environments
• Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM
• Towards a fundamental understanding of the cathode degradation mechanisms
• Systematic structural and chemical characterization of the transition layer at the interface of NO-annealed 4H-SiC/SiO$\sf_2$ metal-oxide-semiconductor field-effect transistors