Compressed Sensing for X-ray Elemental Analysis

Reconstructing sparse EDS data into interpretable results.


A multi-dimensional data analysis toolbox.

Electron/Ion Microscopy Method Development

Novel ways to use incredible tools.

Signal Separation in Electron Microscopy

Investigating how to extract pure signals from spectroscopic data.

Characterization of 4H-SiC MOSFETs

Using TEM to find the impact of interfacial defects on SiC performance.