Welcome!
Dr. Joshua Taillon is a staff scientist within the Office of Data and Informatics at the National Institute of Standards and Technology (Material Measurement Laboratory). As a Materials Research Engineer, his professional interests lie at the intersection of materials characterization and data science, utilizing state-of-the art signal and data processing techniques to facilitate greater understanding of material systems.
Joshua received a B.S. from Cornell University, and as an NSF Graduate Research Fellow, he received his Ph.D. from the University of Maryland under the supervision of Professor Lourdes Salamanca-Riba. While at Maryland, he specialized in analytical transmission electron microscopy and focused ion beam nanotomography, with applications in wide bandgap microelectronics and solid oxide fuel cells. In December 2016, he was presented with a Graduate Student Award from the Materials Research Society for his analytical TEM investigations of 4H-SiC MOSFET interfaces. Following this, he spent two years as a postdoc at NIST working with Dr. Keana Scott (funded by an NRC grant), researching the application of compressed sensing strategies to enhance chemical spectroscopic analysis within electron microscopes.
Interests
- Machine Learning for Materials Science
- Computational Microscopy
- Open Software Development
- Focused Ion Beam Method Development
- Materials Characterization Research
Education
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Ph.D. - Materials Science and Engineering, 2016
University of Maryland, College Park
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M.S. - Materials Science and Engineering, 2014
University of Maryland, College Park
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B.S. - Materials Science and Engineering, 2011
Cornell University
